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Books > Subjects > Science & Math > Experiments, Instruments & Measurement > Electron Microscopes & Microscopy

Advances in Imaging and Electron Physics: Electron Emission Physics (ISSN Book 149)
R 9,454
Advances in Imaging and Electron Physics: Electron Emission Physics (ISSN Book 149)

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope (ISSN Book 159)
R 10,698
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope (ISSN Book 159)

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 162)
R 10,518
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 162)

Advances in Imaging and Electron Physics (ISSN Book 111)
R 9,250
Advances in Imaging and Electron Physics (ISSN Book 111)

Advances in Imaging and Electron Physics (ISSN Book 148)
R 9,454
Advances in Imaging and Electron Physics (ISSN Book 148)

Electron Microscopy of Model Systems (ISSN Book 96)
R 7,608
Electron Microscopy of Model Systems (ISSN Book 96)

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 163)
R 9,645
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 163)

Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications (World Scientific Series In Nanoscience And Nanotechnology Book 7)
R 3,188
Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications (World Scientific Series In Nanoscience And Nanotechnology Book 7)

Organic Nanophotonics: Proceedings of the NATO Advanced Research Workshop, Aix-en-Provence, France, 25-29 August 2002 (NATO Science Series II: Mathematics, Physics and Chemistry Book 100)
R 7,461
Organic Nanophotonics: Proceedings of the NATO Advanced Research Workshop, Aix-en-Provence, France, 25-29 August 2002 (NATO Science Series II: Mathematics, Physics and Chemistry Book 100)

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences Book 48)
R 4,234
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences Book 48)

90 - 100 of 100 Results