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Design-For-Test For Digital IC's and Embedded Core Systems

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Design-For-Test For Digital IC's and Embedded Core Systems

Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.

Country	USA
Author	Alfred Crouch
Binding	Paperback
EAN	9780130848277
ISBN	0130848271
IsEligibleForTradeIn	1
Label	Prentice Hall
Manufacturer	Prentice Hall
NumberOfItems	1
NumberOfPages	347
PublicationDate	1999-07-02
Publisher	Prentice Hall
Studio	Prentice Hall
ReleaseDate	0000-00-00

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