Electron Microprobe Analysis and Scanning Electron Microscopy

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Country USA
Brand Cambridge University Press
Manufacturer Cambridge University Press
Binding Paperback
ItemPartNumber Worked examples or Exercises
ReleaseDate 2010-06-10
UnitCount 1
EANs 9780521142304

Country	USA
Brand	Cambridge University Press
Manufacturer	Cambridge University Press
Binding	Paperback
ItemPartNumber	Worked examples or Exercises
ReleaseDate	2010-06-10
UnitCount	1
EANs	9780521142304

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology