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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Country USA
Brand Springer
Manufacturer Springer
Binding Paperback
ItemPartNumber 193 black & white illustrations
ReleaseDate 2010-10-29
UnitCount 1
EANs 9781441935748

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