Starrett Outside Micrometer with Balanced Frame and Thimble, Satin Chrome Finish and Advanced Sleeve Design - Quick and Easy Adjustment, 1-2" Range, .0001" Graduations - T444.1XRL-2
R 8,246
or 4 x payments of R2,061.50 with
Availability: Currently in Stock
Delivery: 10-20 working days
Please be aware orders placed now will not arrive in time for Christmas, please check delivery times.
Starrett Outside Micrometer with Balanced Frame and Thimble, Satin Chrome Finish and Advanced Sleeve Design - Quick and Easy Adjustment, 1-2" Range, .0001" Graduations - T444.1XRL-2
Heavy-Duty - The Starrett Micrometer has an insulated frame for prevention of temperature related expansion and contraction.
Resists Rust - It is made to last with quality materials that ensure durability and better work performance. It is furnished with a no-glare Starrett satin chrome finish and resists rust.
Easy to Read - The balanced frame and thimble design ensures easy handling and better readability. It's advanced sleeve design comprises of staggered lines and distinct figures, making it easier to take precise and accurate measurements.
Quick Adjusting Tool - The Micrometer is the perfect tool for making quick and easy adjustments. It is accurate and easy to use. Reading in ten-thousandths of an inch (.0001") with a vernier scale on the sleeve.
Accurate Measurements - Starrett precision measuring tools exceed accuracy and performance requirements of national and international standards, providing excellent fine precision tools for industrial, professional and consumer markets worldwide.
T444.1XRL-2 Outside Micrometer .0001" Grad, 1-2" Range, Ratchet Stop, Lock Nut, Carbide Faces. The Starrett T444 Series have heat-insulators on the frame to help reduce temperature-related expansion or contraction. The Vernier scale on the thimble and sleeve is graduated to 0.001", with a satin chrome rust and glare-resistant finish on the thimble. The spindle and anvil have flat measuring faces and are carbide-tipped for wear resistance. A spindle lock helps provide secure locking of the measurement.