Scanning Electron Microscopy: Physics of Image Formation and

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences (45))

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Country USA
Brand Springer
Manufacturer Springer
Binding Hardcover
ItemPartNumber 260 black & white illustrations, 47 blac
UnitCount 1
EANs 9783540639763
ReleaseDate 0000-00-00

Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Hardcover
ItemPartNumber	260 black & white illustrations, 47 blac
UnitCount	1
EANs	9783540639763
ReleaseDate	0000-00-00

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences (45))