Transmission Electron Microscopy: A Textbook for Materials Science
Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Country | USA |
Brand | Springer |
Manufacturer | Springer |
Binding | Hardcover |
ItemPartNumber | 43903781 |
ReleaseDate | 2016-09-05 |
UnitCount | 1 |
EANs | 9783319266497 |