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Books > Subjects > Engineering & Transportation > Engineering > Electrical & Electronics > Circuits > VLSI & ULSI

VLSI Micro- and Nanophotonics: Science, Technology, and Applications
R 10,342
VLSI Micro- and Nanophotonics: Science, Technology, and Applications

Algorithms and Techniques for VLSI Layout Synthesis (The Springer International Series in Engineering and Computer Science, 65)
R 4,375
Algorithms and Techniques for VLSI Layout Synthesis (The Springer International Series in Engineering and Computer Science, 65)

Binary Decision Diagrams and Applications for VLSI CAD (The Springer International Series in Engineering and Computer Science, 342)
R 6,407
Binary Decision Diagrams and Applications for VLSI CAD (The Springer International Series in Engineering and Computer Science, 342)

VLSI Fabrication Principles: Silicon and Gallium Arsenide, 2nd Edition
R 9,593
VLSI Fabrication Principles: Silicon and Gallium Arsenide, 2nd Edition

VLSI DESIGN OF WAVELET TRANSFORM: ANALYSIS, ARCHITECTURE, AND DESIGN EXAMPLES
R 4,561
VLSI DESIGN OF WAVELET TRANSFORM: ANALYSIS, ARCHITECTURE, AND DESIGN EXAMPLES

Logic Minimization Algorithms for VLSI Synthesis (The Springer International Series in Engineering and Computer Science, 2)
R 7,033
Logic Minimization Algorithms for VLSI Synthesis (The Springer International Series in Engineering and Computer Science, 2)

Practical Problems in VLSI Physical Design Automation
R 2,632
Practical Problems in VLSI Physical Design Automation

PSPICE and MATLAB for Electronics: An Integrated Approach, Second Edition (VLSI Circuits)
R 6,052
PSPICE and MATLAB for Electronics: An Integrated Approach, Second Edition (VLSI Circuits)

Skew-Tolerant Circuit Design (The Morgan Kaufmann Series in Computer Architecture and Design)
R 1,526
Skew-Tolerant Circuit Design (The Morgan Kaufmann Series in Computer Architecture and Design)

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)
R 4,100
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)

50 - 60 of 100 Results